Tag Archives: Integrity and Reliability of Integrated Circuits

DARPA’s Kerry Bernstein: SRI Builds Instrument to Find Counterfeit Chips

Defense Advanced Research Projects Agency research partner SRI International has delivered the Advanced Scanning Optical Microscope to the Naval Surface Warfare Center‘s Crane division to aid forensic analysis of integrated circuits and other microelectronics. DARPA said Tuesday the technology supports its Integrity and Reliability of Integrated Circuits program, which aims to detect …

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